For AOI inspection, if use area cameras or line cameras for quality inspection, there have demerits of incompact size, image distortion, image surrounding vague...
All related camera demerits can be overcome by using CIS. From 108mm to 310mm, new large format CIS with 1960mm also launch.

With CIS technology and wireless technology, we are challenging new applications about civil construction.

WHEC CIS have been used for film, print and other machine vision field.
Now we start wafer inspection. With latest technology, we developed wafer identification module. With our CIS and flexible angels of light source, wafer serial number, ID, notch position, wafer pattern and wafer surface dust can be detected easily.

WHEC R&D and Production System Introduction.