One of the key advantages of CIS (Contact Image Sensor) line scan cameras is their ability to integrate the sensor and light source into a single unit. At the same time, inspection requirements vary depending on the material and surface characteristics of the workpiece, as well as the types of defects to be detected. For this reason, selecting and designing the appropriate light source is an important consideration in CIS line scan camera applications.
As a dedicated manufacturer of CIS line scan cameras, we also develop integrated light sources and external lighting solutions for CIS cameras. By addressing the diverse inspection challenges faced by our customers, we strive to provide effective vision inspection solutions that combine CIS cameras with the right illumination.
By integrating the light source into a CIS camera, the camera and lighting can be combined into a single unit, enabling an efficient inspection system even where installation space is limited. In addition to standard light sources, we develop a variety of integrated light sources designed to meet different workpiece characteristics and inspection conditions.
For reflective light sources, for example, users can choose between dual-sided and single-sided illumination. Changing the direction of illumination makes it possible to optimize how surface features and defects appear in the captured image.
We also incorporate various design considerations into the light source structure itself. Depending on the surface characteristics of a workpiece, light from the illumination may be reflected in unintended directions, resulting in unwanted reflections or unevenness in the image. To minimize these effects, we have developed light source structures that take into account the illumination area and the way light is distributed, helping ensure that light reaches the entire workpiece. We also offer different series designed to provide uniform illumination across the workpiece or to minimize shadows caused by illumination.
While integrated light sources allow a CIS camera and lighting to be combined into a compact unit, there are applications where external lighting is a better fit.
For example, external lighting may be preferable when light needs to be applied from an angle that cannot be achieved with an integrated light source, when back light is required, or when a specialized lighting method is needed.
To meet these diverse inspection requirements, we also offer non-light CIS cameras without an integrated light source. Non-light models can be freely combined with the lighting of the customer’s choice, making them suitable for applications where existing lighting equipment needs to be utilized or where lighting needs to be selected according to the overall configuration of the inspection system.
In addition, we develop external lighting specifically for use with our non-light CIS cameras. One of the key advantages of our external lighting is that the lighting timing and intensity can be adjusted directly from the CIS camera. Rather than controlling the camera and lighting separately, both can be managed as part of a single inspection system. This simplifies system integration as well as the configuration of inspection conditions.
In line-scan inspection, in particular, it is important to properly synchronize workpiece movement, camera scanning, and lighting timing. By designing the camera and lighting as a coordinated system, we provide a configuration that is easier to integrate and operate as part of the overall inspection system.
We offer a wide range of external lighting developed specifically for use with our CIS cameras. Our lineup includes lighting designed to provide uniform illumination over a wide area, compact models for illuminating a limited area, Oblique lighting that helps emphasize surface scratches and irregularities, and color lighting that utilizes differences in color. Higher-intensity versions are also available for each type.
The most suitable lighting solution depends on factors such as the workpiece material and shape, surface characteristics, conveying conditions, and the types of defects to be detected. For this reason, we do not consider lighting as a standalone product. Instead, we design and propose lighting solutions together with our CIS line scan cameras, with a focus on achieving the desired image quality for each application.
Our commitment to developing external lighting is driven in part by the challenges and requests we hear from customers in their actual inspection applications.
Based on these needs, we examine the workpiece characteristics and inspection conditions to determine how the light should be applied. When existing lighting solutions cannot adequately address the challenge, we may develop custom lighting specifically designed for use with our CIS cameras.
This is one of the areas of optical expertise we have built through our long-standing focus on CIS line scan cameras. Our work goes beyond improving camera resolution and scanning speed. We also carry out the optical design needed to make the most of these camera capabilities in real-world inspection applications.
The ability to integrate the camera and light source into a single unit is one of the key advantages of CIS cameras. However, as inspection applications become increasingly diverse, a single lighting configuration cannot meet every requirement.
That is why we develop a range of integrated light sources for different applications, including dual-sided and single-sided illumination, light source structures designed to reduce unwanted reflections, and designs that provide illumination across a wide area.
We also offer non-light CIS cameras and a variety of external lighting options, allowing customers to select lighting according to factors such as the illumination area, angle, color, and intensity.
By considering both the CIS line scan camera and lighting, we can propose configurations suited to each customer’s inspection environment.
As a professional manufacturer of CIS line scan cameras, we will continue to develop not only camera technologies but also the optical technologies that support their performance in inspection applications.
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