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What we are showcasing at ITE 2025

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We will be exhibiting at the International Technical Exhibition on Image Technology and Equipment (ITE) 2025, taking place in PACIFICO YOKOHAMA from December 3–5. As one of Japan’s largest machine vision events, ITE brings together leading technologies and innovators from across the industry. As a pioneer in CIS (Contact Image Sensor) technology, WHEC will showcase a wide range of our latest CIS line scan cameras for machine vision. We look forward to welcoming you at Booth D19!

As quality assurance continues to gain importance across the manufacturing industry, there is a growing demand for inspection solutions that deliver higher resolution, higher speed, and greater stability. At this year’s exhibition, WHEC will present its latest CIS line scan camera technologies, accompanied by live demonstrations.

1.  Wafer surface inspection demo using a high-resolution CIS line scan camera

According to the latest forecasts from WSTS (World Semiconductor Trade Statistics), the global semiconductor market is expected to grow by 11.2% year-on-year in 2025, with further expansion projected in 2026. As the market continues to grow, inspection processes within wafer manufacturing have become increasingly critical.
At the same time, manufacturers face several challenges: limited space on existing production lines, the limitations of manual visual inspection, and the difficulties of processing large volumes of image data in real time. Leveraging its key strengths,

WHEC’s CIS line scan cameras are applied in a wide range of wafer-related inspection processes, including wafer ID reading, notch inspection, surface defect inspection, and chip appearance inspection.

・Integrated lens/light sours/camera module, compact and easy installation
・Apply to 4″/6″/8″/12″ wafer inspection
・Supports multi-angle/coaxial/tunnel illumination for diverse and challenging inspection applications
・71kHz speed and 2400DPl precision with real-time inspection

 

2. Surface inspection demo for reflective materials using a CIS line scan camera with reduced glare

Materials such as lithium-ion battery foils, metal-printed surfaces, highly reflective wafer surfaces, and transparent films often make defect detection difficult due to strong specular reflections. WHEC’s coaxial-illumination CIS line scan camera series employs a proprietary illumination design that significantly reduces glare, enabling the capture of clear and consistent images. In addition, the latest model now supports color imaging, allowing accurate color inspection even on highly reflective materials.

See a demo here

3. External-integrated CIS line scan camera

One of the key advantages of CIS line scan cameras is their compact design, integrating the camera module, lens, and light source into a single unit. However, depending on the inspection target and the type or condition of defects, using an external light source can sometimes deliver even clearer results. This CIS line scan camera series integrates external light source modules directly into the camera, making installation simple.
The integrated external light sources also allow angle adjustment. It is particularly well suited for applications such as lithium-ion battery components, as well as film and sheet inspection.

See a demo here

 

4. LIS ultra-high resolution line scan camera

Built on our CIS line scan camera technology, the LIS Series achieves an impressive resolution of up to 4000 dpi (with a pixel size of 10.5 µm).
The latest model now supports the CoaXPress interface, enabling even higher-resolution and higher-speed inspection. This makes it ideal for detecting extremely fine defects in wafer inspection and in various process steps of lithium-ion battery manufacturing.
LIS

 

5. Oblique/Focus Transmission external light source

The external light source units designed for WHEC’s CIS line scan cameras can be used simply by connecting them to the camera, with both lighting timing and intensity fully controlled through the CIS camera. This eliminates the need for time-consuming adjustments between the light source and the CIS line scan camera.

See a demo here

In addition to the products introduced above, we will also showcase a wide range of solution-oriented CIS line scan cameras, including models with scan widths from 108 mm to 800 mm and CIS cameras supporting CoaXPress, Camera Link, and GigE interfaces.

WHEC offers customized CIS line scan camera solutions tailored to your specific requirements—whether that involves scanning width, resolution, scanning speed, interface type, working distance, or physical dimensions.

We invite you to visit our booth and experience the performance of our products firsthand.

―Information―
Place:PACIFICO YOKOHAMA
Date:3-5 December
Both:D19

Contact:Contact|WHEC (w-hec.com)
LinkedIn:WHEC | LinkedIn
YouTube:https://www.youtube.com/@WHECWeihai

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